Hitachi-PMI-Master-Smart
Material Testing Equipment
- RELIABLE LOW LEVELS OF DETECTION NOT JUST FOR C BUT ALSO P, S, B, AS AND SN IN LOW ALLOY STAINLESS STEEL AND N IN DUPLEX STEELS.
- MULTI - CCD OPTICS IN PASCHEN -RUNGE MOUNTING AND OPTIMISED PIXEL RESOLUTION
- WAVELENGTH RANGE: 185 - 672NM
- COMPUTER SYSTEM: INTERNAL COMPUTER UNIT AND TOUCH SCREEN USER INTERFACE
- OPERATION AT 0 - 50 °C WITH AUTOMATIC PROFILING ON EVERY ANALYSIS
